From c8e79a926620e48830778714cfe4b2ea2453fcaf Mon Sep 17 00:00:00 2001 From: jacqueline Date: Fri, 25 Jul 2025 13:33:07 +1000 Subject: Update forked idf components --- lib/fatfs/test_apps/README.md | 4 ++++ 1 file changed, 4 insertions(+) (limited to 'lib/fatfs/test_apps/README.md') diff --git a/lib/fatfs/test_apps/README.md b/lib/fatfs/test_apps/README.md index 2140e8c4..78a9dcd9 100644 --- a/lib/fatfs/test_apps/README.md +++ b/lib/fatfs/test_apps/README.md @@ -1,3 +1,6 @@ +| Supported Targets | ESP32 | ESP32-C2 | ESP32-C3 | ESP32-C5 | ESP32-C6 | ESP32-C61 | ESP32-H2 | ESP32-P4 | ESP32-S2 | ESP32-S3 | +| ----------------- | ----- | -------- | -------- | -------- | -------- | --------- | -------- | -------- | -------- | -------- | + # fatfs component target tests This directory contains tests for `fatfs` component which are run on chip targets. @@ -9,6 +12,7 @@ Fatfs tests can be executed with different `diskio` backends: `diskio_sdmmc` (SD - [sdcard](sdcard/) — runs fatfs tests with an SD card over SDMMC or SDSPI interface - [flash_wl](flash_wl/) - runs fatfs test in a wear_levelling partition in SPI flash - [flash_ro](flash_ro/) - runs fatfs test in a read-only (no wear levelling) partition in SPI flash +- [dyn_buffers](dyn_buffers/) - check if enabling dynamic buffers in FATFS has an effect These test apps define: - test functions -- cgit v1.2.3